Advanced backside failure analysis in 65 nm CMOS...

Microelectronics Reliability 2007 Vol. 47; Iss. 9-11

Advanced backside failure analysis in 65 nm CMOS technology

Stephane Bianic, Stéphanie Allemand, Grégory Kerrosa, Pascal Scafidi, Didier Renard
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
47
Year:
2007
Language:
english
Pages:
5
DOI:
10.1016/j.microrel.2007.07.076
File:
PDF, 1019 KB
english, 2007
Conversion to is in progress
Conversion to is failed