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[IEEE Twenty-Fifth International Symposium on Fault-Tolerant Computing, 1995, ' Highlights from Twenty-Five Years'. - Pasadena, CA (June 27-30 1995)] Twenty-Fifth International Symposium on Fault-Tolerant Computing, 1995, ' Highlights from Twenty-Five Years'. - RANDOM TESTING OF THE DATA PROCESSING SECTION OF A MICROPROCESSOR

Thevenod-Fosse, P., David, R.
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Year:
1995
Language:
english
DOI:
10.1109/ftcsh.1995.532657
File:
PDF, 661 KB
english, 1995
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