![](/img/cover-not-exists.png)
[IEEE Twenty-Fifth International Symposium on Fault-Tolerant Computing, 1995, ' Highlights from Twenty-Five Years'. - Pasadena, CA (June 27-30 1995)] Twenty-Fifth International Symposium on Fault-Tolerant Computing, 1995, ' Highlights from Twenty-Five Years'. - RANDOM TESTING OF THE DATA PROCESSING SECTION OF A MICROPROCESSOR
Thevenod-Fosse, P., David, R.Year:
1995
Language:
english
DOI:
10.1109/ftcsh.1995.532657
File:
PDF, 661 KB
english, 1995