Impact of single pMOSFET dielectric degradation on NAND...

Microelectronics Reliability 2008 Vol. 48; Iss. 3

Impact of single pMOSFET dielectric degradation on NAND circuit performance

D. Estrada, M.L. Ogas, R.G. Southwick III, P.M. Price, R.J. Baker, W.B. Knowlton
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
48
Year:
2008
Language:
english
Pages:
10
DOI:
10.1016/j.microrel.2007.09.002
File:
PDF, 1.42 MB
english, 2008
Conversion to is in progress
Conversion to is failed