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[IEEE 2009 International Conference on Microelectronics - ICM - Marrakech, Morocco (2009.12.19-2009.12.22)] 2009 International Conference on Microelectronics - ICM - Annealing of Irradiated-Induced defects in power MOSFETs
Bendada, Elmaati, Malaoui, Abdessamad, Mabrouki, Mustapha, Quotb, Kamal, Rais, KhalidYear:
2009
Language:
english
DOI:
10.1109/icm.2009.5418641
File:
PDF, 458 KB
english, 2009