Simulation of transient thermal states in layered...

Microelectronics Reliability 2008 Vol. 48; Iss. 7

Simulation of transient thermal states in layered electronic microstructures

Włodzimierz Kalita, Dariusz Klepacki, Mariusz Węglarski
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Volume:
48
Year:
2008
Language:
english
Pages:
6
DOI:
10.1016/j.microrel.2008.03.019
File:
PDF, 680 KB
english, 2008
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