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Impact of bias condition on 1/f noise of dual-gate depletion type MOSFET in linear region and consequences for noise diagnostic application and modelling
M. Videnovic-Misic, M.M. JevticVolume:
48
Year:
2008
Language:
english
Pages:
7
DOI:
10.1016/j.microrel.2008.04.002
File:
PDF, 467 KB
english, 2008