Correlation studies for component level ball impact shear...

Microelectronics Reliability 2008 Vol. 48; Iss. 7

Correlation studies for component level ball impact shear test and board level drop test

E.H. Wong, R. Rajoo, S.K.W. Seah, C.S. Selvanayagam, W.D. van Driel, J.F.J.M. Caers, X.J. Zhao, N. Owens, L.C. Tan, M. Leoni, P.L. Eu, Y.-S. Lai, C.-L. Yeh
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
48
Year:
2008
Language:
english
Pages:
10
DOI:
10.1016/j.microrel.2008.04.008
File:
PDF, 1.22 MB
english, 2008
Conversion to is in progress
Conversion to is failed