A wafer-level approach to device lifetesting

Microelectronics Reliability 2008 Vol. 48; Iss. 7

A wafer-level approach to device lifetesting

Dorothy June M. Hamada, William J. Roesch
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Volume:
48
Year:
2008
Language:
english
Pages:
5
DOI:
10.1016/j.microrel.2008.04.020
File:
PDF, 909 KB
english, 2008
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