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[IEEE 2011 International Semiconductor Device Research Symposium (ISDRS) - College Park, MD, USA (2011.12.7-2011.12.9)] 2011 International Semiconductor Device Research Symposium (ISDRS) - Low-frequency noise in high-k LaLuO3/TiN MOSFETs
Olyaei, Maryam, Malm, B. Gunnar, Litta, Eugenio D., Hellstrom, Per-Erik, Ostling, MikaelYear:
2011
Language:
english
DOI:
10.1109/isdrs.2011.6135204
File:
PDF, 83 KB
english, 2011