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[IEEE 1999 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings - Santa Clara, CA, USA (11-13 Oct. 1999)] 1999 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings (Cat No.99CH36314) - IC performance prediction for test cost reduction
Jungran Lee,, Walker, D.M.H., Milor, L., Yeng Peng,, Hill, G.Year:
1999
Language:
english
DOI:
10.1109/issm.1999.808750
File:
PDF, 251 KB
english, 1999