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Experimental and simulation studies of resistivity in nanoscale copper films
A. Emre Yarimbiyik, Harry A. Schafft, Richard A. Allen, Mark D. Vaudin, Mona E. ZaghloulVolume:
49
Year:
2009
Language:
english
Pages:
8
DOI:
10.1016/j.microrel.2008.11.003
File:
PDF, 682 KB
english, 2009