A Comparison of Fast Methods for Measuring NBTI Degradation

IEEE Transactions on Device and Materials Reliability 2007 / 12 Vol. 7; Iss. 4

A Comparison of Fast Methods for Measuring NBTI Degradation

Reisinger, Hans, Brunner, Ulrich, Heinrigs, Wolfgang, Gustin, Wolfgang, Schlunder, Christian
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Volume:
7
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2007.911385
Date:
December, 2007
File:
PDF, 313 KB
english, 2007
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