Electromagnetic immunity model of an ADC for...

Microelectronics Reliability 2009 Vol. 49; Iss. 9-11

Electromagnetic immunity model of an ADC for microcontroller’s reliability improvement

Jean-Baptiste Gros, Geneviève Duchamp, Alain Meresse, Jean-Luc Levant
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Volume:
49
Year:
2009
Language:
english
Pages:
4
DOI:
10.1016/j.microrel.2009.06.013
File:
PDF, 693 KB
english, 2009
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