Influence of various process steps on the reliability of...

Influence of various process steps on the reliability of PMOSFETs submitted to negative bias temperature instabilities

Christelle Bénard, Gaëtan Math, Pascal Fornara, Jean-Luc Ogier, Didier Goguenheim
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Volume:
49
Year:
2009
Language:
english
Pages:
5
DOI:
10.1016/j.microrel.2009.06.022
File:
PDF, 758 KB
english, 2009
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