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[IEEE 2010 International Conference on Machine Learning and Cybernetics (ICMLC) - Qingdao, China (2010.07.11-2010.07.14)] 2010 International Conference on Machine Learning and Cybernetics - X-ray image classification using Random Forests with Local Binary Patterns
Kim, Seong-Hoon, Lee, Ji-Hyun, Ko, Byoungchul, Nam, Jae-YealYear:
2010
Language:
english
DOI:
10.1109/icmlc.2010.5580711
File:
PDF, 229 KB
english, 2010