[IEEE 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - San Jose, CA, USA (April 17-21, 2005)] 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - The influence of a silicon dioxide-filled trench isolation structure and implanted sub-collector on latchup robustness
Voldman, S., Gebreselasic, E., Lanzerotti, L., Larsen, T., Feilchenfeld, N., St. Onge, S., Joseph, A., Dunn, J.Year:
2005
Language:
english
DOI:
10.1109/relphy.2005.1493072
File:
PDF, 1.57 MB
english, 2005