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Characterization of ageing failures on power MOSFET devices by electron and ion microscopies
D. Martineau, T. Mazeaud, M. Legros, Ph. Dupuy, C. Levade, G. VanderschaeveVolume:
49
Year:
2009
Language:
english
Pages:
4
DOI:
10.1016/j.microrel.2009.07.011
File:
PDF, 417 KB
english, 2009