Investigation of defects introduced by static and dynamic...

Microelectronics Reliability 2009 Vol. 49; Iss. 9-11

Investigation of defects introduced by static and dynamic hot carrier stress on SOI partially depleted body-contact MOSFETs

M.A. Exarchos, G.J. Papaioannou, J. Jomaah, F. Balestra
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Volume:
49
Year:
2009
Language:
english
Pages:
6
DOI:
10.1016/j.microrel.2009.07.024
File:
PDF, 492 KB
english, 2009
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