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Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping system
G. Haberfehlner, S. Bychikhin, V. Dubec, M. Heer, A. Podgaynaya, M. Pfost, M. Stecher, E. Gornik, D. PoganyVolume:
49
Year:
2009
Language:
english
Pages:
6
DOI:
10.1016/j.microrel.2009.07.032
File:
PDF, 1.17 MB
english, 2009