Multiscale simulation of aluminum thin films for the design...

Multiscale simulation of aluminum thin films for the design of highly-reliable MEMS devices

Haruka Kubo, Mauro Ciappa, Takayuki Masunaga, Wolfgang Fichtner
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Volume:
49
Year:
2009
Language:
english
Pages:
5
DOI:
10.1016/j.microrel.2009.07.034
File:
PDF, 808 KB
english, 2009
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