Strain estimation in III–V materials by analysis of the...

Microelectronics Reliability 2010 Vol. 50; Iss. 4

Strain estimation in III–V materials by analysis of the degree of polarization of luminescence

Daniel T. Cassidy, Chadwick K. Hall, Othman Rehioui, Laurent Bechou
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Volume:
50
Year:
2010
Language:
english
Pages:
5
DOI:
10.1016/j.microrel.2009.11.003
File:
PDF, 1.64 MB
english, 2010
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