[IEEE 2008 9th International Conference on Ultimate Integration on Silicon (ULIS) - Udine, Italy (2008.03.12-2008.03.14)] 2008 9th International Conference on Ultimate Integration of Silicon - Feasibility of SIO2/Al2O3 tunnel dielectric for future Flash memories generations
Padovani, Andrea, Larcher, Luca, Verma, Sarves, Pavan, Paolo, Majhi, Prashant, Kapur, Pawan, Parat, Krishna, Bersuker, Gennadi, Saraswat, KrishnaYear:
2008
DOI:
10.1109/ulis.2008.4527152
File:
PDF, 186 KB
2008