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[IEEE 2008 11th International Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS) - Bratislava, Slovakia (2008.04.16-2008.04.18)] 2008 11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems - Software-Based Self-Test Strategy for Data Cache Memories Embedded in SoCs
Perez H., W. J., Medina, J. Velasco, Ravotto, D., Sanchez, E., Reorda, M. SonzaYear:
2008
Language:
english
DOI:
10.1109/ddecs.2008.4538813
File:
PDF, 3.42 MB
english, 2008