Investigation on the abnormal resistive switching induced...

Microelectronics Reliability 2010 Vol. 50; Iss. 12

Investigation on the abnormal resistive switching induced by ultraviolet light exposure based on HfOx film

Kow-Ming Chang, Wen-Hsien Tzeng, Kou-Chen Liu, Yi-Chun Chan, Chun-Chih Kuo
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Volume:
50
Year:
2010
Language:
english
Pages:
4
DOI:
10.1016/j.microrel.2010.05.012
File:
PDF, 646 KB
english, 2010
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