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Characteristics degradation of the SiGe HBT under electromagnetic field stress
A. Alaeddine, M. Kadi, K. Daoud, B. BeydounVolume:
50
Year:
2010
Language:
english
Pages:
6
DOI:
10.1016/j.microrel.2010.07.002
File:
PDF, 894 KB
english, 2010