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[IEEE Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 - Taiwan (5-8 July 2004)] Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) - Achievements and challenges for the electrical performance of MOSFETs with high-k gate dielectrics
Groeseneken, G., Pantisano, L., Ragnarsson, L.-A., Degraeve, R., Houssa, M., Kauerauf, T., Roussel, P., De Gendt, S., Heyns, M.Year:
2004
Language:
english
DOI:
10.1109/ipfa.2004.1345574
File:
PDF, 664 KB
english, 2004