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Time-To-Latch-Up investigation of SCR devices as ESD protection structures on 65 nm technology platform
A. Tazzoli, M. Cordoni, P. Colombo, C. Bergonzoni, G. MeneghessoVolume:
50
Year:
2010
Language:
english
Pages:
6
DOI:
10.1016/j.microrel.2010.07.028
File:
PDF, 1.16 MB
english, 2010