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Destructive events in NAND Flash memories irradiated with heavy ions
M. Bagatin, S. Gerardin, A. Paccagnella, G. Cellere, F. Irom, D.N. NguyenVolume:
50
Year:
2010
Language:
english
Pages:
5
DOI:
10.1016/j.microrel.2010.07.032
File:
PDF, 592 KB
english, 2010