Scan chain failure analysis using laser voltage imaging

Scan chain failure analysis using laser voltage imaging

Joy Y. Liao, Steven Kasapi, Bruce Cory, Howard Lee Marks, Yin S. Ng
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Volume:
50
Year:
2010
Language:
english
Pages:
5
DOI:
10.1016/j.microrel.2010.07.101
File:
PDF, 2.49 MB
english, 2010
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