Investigation on the effect of annealing process parameters...

Microelectronics Reliability 2011 Vol. 51; Iss. 8

Investigation on the effect of annealing process parameters on AuGeNi ohmic contact to n-GaAs using microstructural characteristics

S. Tahamtan, A. Goodarzi, S.P. Abbasi, A. Hodaei, M.S. Zabihi, J. Sabbaghzadeh
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Volume:
51
Year:
2011
Language:
english
Pages:
7
DOI:
10.1016/j.microrel.2011.03.039
File:
PDF, 1.21 MB
english, 2011
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