Characterization and modeling of hot carrier injection in...

Microelectronics Reliability 2011 Vol. 51; Iss. 8

Characterization and modeling of hot carrier injection in LDMOS for L-band radar application

L. Lachéze, O. Latry, P. Dherbécourt, K. Mourgues, V. Purohit, H. Maanane, J.P. Sipma, F. Cornu, P. Eudeline
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
51
Year:
2011
Language:
english
Pages:
6
DOI:
10.1016/j.microrel.2011.03.040
File:
PDF, 770 KB
english, 2011
Conversion to is in progress
Conversion to is failed