[IEEE 2005 IEEE Conference on Electron Devices and Solid-State Circuits - Hong Kong (19-21 Dec. 2005)] 2005 IEEE Conference on Electron Devices and Solid-State Circuits - Monitoring of Switching Activity and Transition Times of Clock Signals in SoC Cells by Estimation of the Mean Value of IDD Current
P. Dziurdzia,Year:
2005
Language:
english
DOI:
10.1109/edssc.2005.1635384
File:
PDF, 679 KB
english, 2005