[IEEE 2010 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT) - Kyoto, Japan (2010.10.6-2010.10.8)] 2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems - Warning Prediction Sequential for Transient Error Prevention
Das, Bishnu Prasad, Onodera, HidetoshiYear:
2010
Language:
english
DOI:
10.1109/dft.2010.52
File:
PDF, 285 KB
english, 2010