[IEEE 1998 Sixth International Workshop on Computational Electronics. Extended Abstracts - Osaka, Japan (19-21 Oct. 1998)] 1998 Sixth International Workshop on Computational Electronics. Extended Abstracts (Cat. No.98EX116) - DRAM bit-line coupling noise analysis and simulation of process sensitivity for COB scheme
Li-Fu Chang,, Min-Hwa Chi,Year:
1998
Language:
english
DOI:
10.1109/iwce.1998.742743
File:
PDF, 360 KB
english, 1998