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[IEEE 2007 32nd IEEE/CPMT International Electronic Manufacturing Technology Symposium - San Jose, CA, USA (2007.10.3-2007.10.5)] 2007 32nd IEEE/CPMT International Electronic Manufacturing Technology Symposium - Test Database Analysis - Inferences from a Disposition Tree
Lee, Jia Keat, Phon-Amnuaisuk, Somnuk, Lee Hong Yong,, Thum, Siew Beng, Ho, Chin Kuan, Chew, Huat ChinYear:
2007
Language:
english
DOI:
10.1109/iemt.2007.4417052
File:
PDF, 748 KB
english, 2007