[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - Second breakdown behavior in bipolar ESD protection devices during low current long duration stress and its relation to moving current-tubes
Johnsson, David, Mamanee, Wasinee, Bychikhin, Sergey, Pogany, Dionyz, Gornik, Erich, Stecher, MatthiasYear:
2008
Language:
english
DOI:
10.1109/relphy.2008.4558893
File:
PDF, 797 KB
english, 2008