[IEEE Eleventh IEEE European Test Symposium (ETS'06) - Southampton, UK (21-21 May 2006)] Eleventh IEEE European Test Symposium (ETS'06) - On-Chip Evaluation, Compensation, and Storage of Scan Diagnosis Data - A Test Time Efficient Scan Diagnosis Architecture
Poehl, F., Rzeha, J., Beck, M., Goessel, M., Arnold, R., Ossimitz, P.Year:
2006
Language:
english
DOI:
10.1109/ets.2006.34
File:
PDF, 256 KB
english, 2006