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[IEEE 2010 IEEE International Conference on Industrial Technology - Vi a del Mar , Chile (2010.03.14-2010.03.17)] 2010 IEEE International Conference on Industrial Technology - Fault detection of univariate non-Gaussian data with Bayesian network
Verron, Sylvain, Tiplica, Teodor, Kobi, AbdessamadYear:
2010
Language:
english
DOI:
10.1109/icit.2010.5472659
File:
PDF, 431 KB
english, 2010