[IEEE The Fifth International Conference on Advanced Semiconductor Devices and Microsystems, 2004. ASDAM 2004. - Smolenice Castle, Slovakia (Oct. 17-21, 2004)] The Fifth International Conference on Advanced Semiconductor Devices and Microsystems, 2004. ASDAM 2004. - Measurement and determination of the carrier concentration profile of semiconductor layers by PCIV method
Hulenyi, L., Kinder, R., Kuruc, M.Year:
2004
Language:
english
DOI:
10.1109/asdam.2004.1441168
File:
PDF, 727 KB
english, 2004