[IEEE 12th IEEE International Conference on Advanced Thermal Processing of Semiconductors - Portland, OR, USA (28-30 Sept. 2004)] 12th IEEE International Conference on Advanced Thermal Processing of Semiconductors, 2004. RTP 2004. - Status of NIST near infrared emittance measurement system
Hanssen, L.M., Rink, M., Mekhontsev, S.N.Year:
2004
Language:
english
DOI:
10.1109/rtp.2004.1441957
File:
PDF, 534 KB
english, 2004