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[IEEE 2012 IEEE International Interconnect Technology Conference - IITC - San Jose, CA, USA (2012.06.4-2012.06.6)] 2012 IEEE International Interconnect Technology Conference - Effect of W doping on bipolar resistive switching behavior of TiN/W:NbOx/Pt device
Lee, Kyumin, Kim, Jonggi, Lee, Sunghoon, Park, Sunghoon, Sohn, HyunchulYear:
2012
Language:
english
DOI:
10.1109/iitc.2012.6251647
File:
PDF, 404 KB
english, 2012