![](/img/cover-not-exists.png)
[IEEE 2012 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2012.11.5-2012.11.8)] 2012 IEEE International Test Conference - Hybrid selector for high-X scan compression
Wohl, P., Waicukauski, J. A., Neuveux, F., Colburn, J. E.Year:
2012
Language:
english
DOI:
10.1109/test.2012.6401558
File:
PDF, 491 KB
english, 2012