[IEEE 2012 IEEE International Test Conference (ITC) -...

  • Main
  • [IEEE 2012 IEEE International Test...

[IEEE 2012 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2012.11.5-2012.11.8)] 2012 IEEE International Test Conference - Hybrid selector for high-X scan compression

Wohl, P., Waicukauski, J. A., Neuveux, F., Colburn, J. E.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2012
Language:
english
DOI:
10.1109/test.2012.6401558
File:
PDF, 491 KB
english, 2012
Conversion to is in progress
Conversion to is failed