[IEEE 2012 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu (2012.04.23-2012.04.25)] Proceedings of Technical Program of 2012 VLSI Design, Automation and Test - Area and reliability efficient ECC scheme for 3D RAMs
Li-Jung Chang,, Yu-Jen Huang,, Jin-Fu Li,Year:
2012
Language:
english
DOI:
10.1109/vlsi-dat.2012.6212645
File:
PDF, 348 KB
english, 2012