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[IEEE 14th Asian Test Symposium (ATS'05) - Calcutta, India (2005.12.21-2005.12.21)] 14th Asian Test Symposium (ATS'05) - Improved Delay Fault Coverage Using Subsets of Flip-flops to Launch Transitions
Devtaprasanna, N., Reddy, S.M., Gunda, A., Krishnamurthy, P., Pomeranz, I.Year:
2005
Language:
english
DOI:
10.1109/ats.2005.68
File:
PDF, 211 KB
english, 2005