[IEEE Comput. Soc 20th IEEE VLSI Test Symposium (VTS 2002) - Monterey, CA, USA (28 April-2 May 2002)] Proceedings 20th IEEE VLSI Test Symposium (VTS 2002) - Evaluation of effectiveness of median of absolute deviations outlier rejection-based I/sub DDQ/ testing for burn-in reduction
Sabade, S.S., Walker, D.M.Year:
2002
Language:
english
DOI:
10.1109/vts.2002.1011115
File:
PDF, 1014 KB
english, 2002