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[IEEE IEEE International Conference on Test, 2005. - Charlotte, NC, USA (Nov. 8, 2005)] IEEE International Conference on Test, 2005. - Use of MISR Output Streams for Diagnostics
Keller, B., Bartenstein, T.Year:
2005
Language:
english
DOI:
10.1109/TEST.2005.1584036
File:
PDF, 362 KB
english, 2005