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[IEEE 2010 IEEE AUTOTESTCON - Orlando, FL, USA (2010.09.13-2010.09.16)] 2010 IEEE AUTOTESTCON - Integrated diagnostic/prognostic experimental setup for capacitor degradation and health monitoring
Kulkarni, Chetan, Biswas, Gautam, Koutsoukos, Xenofon, Celaya, Jose, Goebel, KaiYear:
2010
Language:
english
DOI:
10.1109/autest.2010.5613596
File:
PDF, 693 KB
english, 2010