[IEEE APCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS) - Macao, China (2008.11.30-2008.12.3)] APCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems - Cumulative electrostatic discharge induced degradation of power-rail ESD clamp device in high-voltage CMOS/DMOS technologies

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