![](/img/cover-not-exists.png)
[IEEE 53rd Electronic Components and Technology Conference, 2003. - New Orleans, Louisiana, USA (May 27-30, 2003)] 53rd Electronic Components and Technology Conference, 2003. Proceedings. - Comparison of electrical and optical interconnect
Jaernin Shin,, Chung-Seok Seo,, Chellappa, A., Brooke, M., Chattejce, A., Jokerst, N.M.Year:
2003
Language:
english
DOI:
10.1109/ECTC.2003.1216422
File:
PDF, 488 KB
english, 2003