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[IEEE 2014 IEEE Symposium on VLSI Circuits - Honolulu, HI, USA (2014.6.10-2014.6.13)] 2014 Symposium on VLSI Circuits Digest of Technical Papers - An exact measurement and repair circuit of TSV connections for 128GB/s high-bandwidth memory(HBM) stacked DRAM
Dong Uk Lee,, Kyung Whan Kim,, Kwan Weon Kim,, Kang Seol Lee,, Sang Jin Byeon,, Jin Hee Cho,, Han Ho Jin,, Sang Kyun Nam,, Jaejin Lee,, Jun Hyun Chun,, Sungjoo Hong,Year:
2014
Language:
english
DOI:
10.1109/vlsic.2014.6858368
File:
PDF, 1.53 MB
english, 2014